Semiconductor devices. Mechanical and climatic test methods - Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods - Particle impact noise detection (PIND)
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What is BS EN 60749-16 – Particle impact noise detection about?
BS EN 60749-16 is an international standard that focuses on the quality and performance of semiconductor devices and particle impact noise detection. BS EN 60749-16 serves the purpose to detect the presence of loose particles inside a cavity device such as chips of ceramic, pieces of bonding wire, or solder balls (prills). BS EN 60749-16 stipulates the technicalities such as related terms and definitions, test apparatus, test sample, test procedures, evaluation, etc., for the mechanical and climatic test methods for semiconductor devices with memory.
Who is BS EN 60749-16
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