Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices. Mechanical and climatic test methods - Flammability of plastic-encapsulated devices (internally induced)
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What is BS EN 60749-31 – Plastic encapsulated devices about?
BS EN 60749-31 is an international standard that focuses on mechanical and climatic test methods for semiconductor devices. BS EN 60749-31 establishes mechanical and climatic test methods for semiconductor devices with memory when subjected to energetic particles such as alpha radiation. It can be applied to any type of integrated circuit with a memory device. Note: BS EN 60749-31 is identical to the test method contained in 1.1 of chapter 4 of IEC 60749 (1996), apart from changes to this clause, the addition of titles to clauses 2 and 3 and renumbering.
Who is BS EN 60749-31 -
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