Semiconductor devices. Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods - Soft error test method for semiconductor devices with memory
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What is BS EN 60749-38 – Soft error test for semiconductor devices ?
BS EN 60749-38 is an international standard that focuses on soft error test methods for semiconductor devices. BS EN 60749-38 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation. It can be applied to any type of integrated circuit with a memory device. BS EN 60749-38 stipulates the technicalities such as related terms and definitions, test apparatus, test sample, test procedures, evaluation, etc., for the soft error test method for semiconductor devices with memory .
Who is BS EN 60749-38 - Soft error test for semiconductor devices ?
BS EN 60749-38 on soft error test for semiconductor devices is useful for:
Semiconductor device manufacturers Manufacturer of electronic devices Manufacturers and suppliers of semiconductor devices Product design engineers Quality assurance authority Regulatory authorities
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