BS IEC 62899-503-3:2021 PDF

Printed electronics - Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

Название (английский):

BS IEC 62899-503-3:2021

Printed electronics - Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method

Статус документа:: Действующий
Формат:: Электронный (PDF)
Дата публикации:: 30 сентября 2021 г.
ICS:: 29.045
SKU:: BS IEC 62899-503-3:2021

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Abstract

1 Scope This PART of IEC 62899 specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method ( TLM ). The method requires the fabrication of a test element group (TEG) with varying channel length ( L ) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.

BS IEC 62899-503-3:2021 PDF

Abstract

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Abstract

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