BS IEC 62951-1:2017 PDF

Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates

Название (английский):

BS IEC 62951-1:2017

Semiconductor devices. Flexible and stretchable semiconductor devices - Bending test method for conductive thin films on flexible substrates

Статус документа:: Действующий
Формат:: Электронный (PDF)
Дата публикации:: 31 мая 2018 г.
ICS:: 31.080.99
SKU:: BS IEC 62951-1:2017

Тип поставки:

Full version50 €Read online 24h10 €Read online 72h15 €

Язык документа:

ruen

Срок поставки:1 раб. дн. (перевод)

Цена:50 €

Abstract

What is BS IEC 62951 ‑ 1 - Flexible and stretchable semiconductor devices about?

BS IEC 62951-1 is an international standard that discusses semiconductor devices for flexible and stretchable semiconductor devices. BS IEC 62951 ‑ 1 is the first part of the multi-series that specifies a bending test method to measure the electromechanical properties or flexibility of conductive thin films deposited or bonded on flexible non-conductive substrates.

BS IEC 62951-1:2017 PDF

Abstract

Похожие стандарты

Abstract

Похожие стандарты

Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for sheet resistance of f…

Aerospace series. Circuit breakers. Test methods. Performance with a locked tripping system.

Information technology. Electronic discovery. Technical readiness.

Test conditions for machining centres. Accuracy and repeatability of positioning of linear and rotary axes.

Aerospace series. Acrylonitrile-butadiene rubber (NBR). Low temperature resistant. Hardness 60 IRHD.

Mountaineering equipment. Frictional anchors. Safety requirements and test methods.

Health Informatics. General purpose information components. Non-clinical.

Ambient air. Standard method for the measurement of the concentration of carbon monoxide by non-dispersive in…