Nanotechnologies. Characterization of multiwall carbon nanotubes. Mesoscopic shape factors
Nanotechnologies. Characterization of multiwall carbon nanotubes. Mesoscopic shape factors
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1 Scope This Technical Specification describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy ( SEM ), transmission electron microscopy ( TEM ), viscometry, and light scattering analysis. This Technical Specification also includes additional terms needed to define the characterization of scattered bending persistence length ( SBPL ). Two approximation methods are given for the evaluation of SBPL (which generally varies from several tens of nanometers to several hundred micrometers). Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.
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