GOST R 71334-2024 PDF
Name in English:
GOST R 71334-2024
Name in Russian:
ГОСТ Р 71334-2024
Description in English:
Epitaxial structures. Мethod for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference
Description in Russian:
Структуры эпитаксиальные. Метод измерения толщины эпитаксиальных слоев кремния в структурах типа кремний на сапфире на основе инфракрасной интерференции
Document status:
Active
Format:
Electronic (PDF)
Page count:
8
Delivery time (for English version):
2 business days
Delivery time (for Russian version):
1 business day
SKU:
GOST49426
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