IEC 60749-36:2003 PDF
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Название (английский):
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 7
- Дата публикации:
- 13 февраля 2003 г.
- Издание:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
Описание (английский):
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Технические детали
- Технический комитет
- TC 47 - Semiconductor devices
- SKU
- IEC 60749-36:2003