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IEC 61189-2-809:2024 PDF

Test methods for electrical materials, circuit boards and other interconnection structures and assemblies – Part 2-809: X/Y coefficient of thermal expansion (CTE) test for thick base materials by TMA

Название (английский):
IEC 61189-2-809:2024

Test methods for electrical materials, circuit boards and other interconnection structures and assemblies – Part 2-809: X/Y coefficient of thermal expansion (CTE) test for thick base materials by TMA

Статус документа:
Действующий
Формат:
Электронный (PDF)
Количество страниц:
17
Дата публикации:
9 декабря 2024 г.
Издание:
IEC IS 61189 edition 1 version 1
ICS:
31.180
Описание (английский):

IEC 61189-2-809:2024 defines the method to be followed for the determination of the X/Y coefficient of thermal expansion of electrical insulating materials by the use of a thermomechanical analyser (TMA). This method is applicable to materials that are solid of the entire range of temperature used and retain sufficient hardness and rigidity over the temperature range so that irreversible indentation of the specimen by the sensing probe does not occur.

Технические детали

Технический комитет
TC 91 - Electronics assembly technology
SKU
IEC 61189-2-809:2024