Overview
IEC 61671-6:2016 / IEEE Std 1671.6-2015 specifies an exchange format, based on XML, for describing a test station used with automatic test equipment (ATE) and automatic test systems (ATS). It defines both the static test station description and the runtime instance information to enable consistent sharing of hardware, software and documentation details across tools and organizations. The standard is part of the Automatic Test Markup Language (ATML) family and is published jointly by IEC and IEEE.
Key Topics and Technical Requirements
- XML schemas: The standard provides formal schemas (notably TestStationDescription.xsd and TestStationInstance.xsd) that define the structure and allowable elements for test station information.
- Elements and complex types: Definitions for top-level elements, child elements and complex types that represent components of a test station (hardware, software, documentation, connectivity).
- Instance documents: Rules for creating conformant ATML instance documents that describe a particular test station or a specific test station instance.
- Schema extensibility: Guidance on extending the ATML schemas safely to accommodate vendor- or site-specific data while maintaining interoperability.
- Conformance: Criteria for validating that TestStationDescription and TestStationInstance documents meet the standard’s requirements.
- Informative annexes: Examples, glossary and bibliography to support implementation and interpretation.
Practical Applications
- Test system integration: Exchange comprehensive test station metadata between ATE vendors, test program sets and enterprise test management systems to automate deployment and configuration.
- Asset management: Maintain accurate inventories of test station hardware and software for maintenance, calibration and lifecycle planning.
- Interoperability: Enable different test tools and diagnostic software to interpret a common description of test station resources, reducing manual configuration errors.
- Test program portability: Support reuse of test program sets across multiple stations by providing machine-readable descriptions of station capabilities.
- Documentation and compliance: Produce consistent, machine-verifiable documentation for audits, safety reviews and certification efforts.
Who uses it: test engineers, ATE and ATS manufacturers, system integrators, test software vendors, maintenance planners and test program developers.
Related Standards
- IEEE Std 1671.6-2015 is the corresponding IEEE document (dual-logo publication). IEC 61671-6 is part of the broader ATML framework of component standards that define XML schemas for the test environment.
Keywords: IEC 61671-6:2016, ATML, test station description, XML schema, TestStationDescription.xsd, TestStationInstance.xsd, automatic test equipment, ATE, automatic test system, test station instance, schema extensibility, conformance.