Overview - IEC 61926-1:1999 (C/ATLAS)
IEC 61926-1:1999 defines a high‑order, vendor‑neutral test language - Common Abbreviated Test Language for All Systems (C/ATLAS) - for electronics testing and design automation. The standard specifies the syntax, program/module structure, declarations, and procedural constructs so test programs can be written independent of any specific automatic test equipment (ATE). C/ATLAS enables portable, reusable test descriptions for production, validation and maintenance of electronic assemblies.
Key topics and technical requirements
The standard covers a comprehensive test‑language specification. Major technical topics include:
- Program and module structure: rules for layout, statement fields and terminators.
- Preamble and declarations: DEFINE, DECLARE and signal/complex‑signal definitions for test data and configuration.
- Procedures and control flow: structured procedures, IF/WHILE/FOR constructs, GO TO, PERFORM and procedure termination semantics.
- Signal‑oriented statements: SETUP, CONNECT, ARM, FETCH, APPLY, MEASURE, VERIFY and digital STIMULATE/SENSE/PROVE actions.
- Timing and synchronization: timer read/reset, WAIT FOR, DO SIMULTANEOUS and DO TIMED DIGITAL constructs.
- Databus and exchange handling: DEFINE EXCHANGE, DO EXCHANGE and exchange‑configuration statements for databus/communication tests.
- Events and identifiers: IDENTIFY TIMER, SIGNAL BASED EVENT, EVENT INDICATOR and time/event‑based constructs.
- Extensibility and document conventions: rules for extending the language and organizing syntax (document precedence and conventions).
The standard organizes these topics into normative clauses (syntax, statements and structures) and provides guidance for implementers to ensure consistent interpretation across ATE platforms.
Practical applications and users
C/ATLAS (IEC 61926-1) is used where standardized, portable test programs are required:
- Test engineers and test developers writing production and functional test programs.
- ATE vendors implementing language interpreters and converters to map C/ATLAS onto hardware resources.
- Manufacturers and contract test houses needing vendor‑neutral test program exchange and reuse.
- Design for Test (DFT) and QA teams integrating automated tests into product verification and manufacturing flows.
Benefits include improved interoperability, reduced test re‑development, and clearer test documentation across platforms.
Related standards and references
- IEC 61926 series (design automation / test language family)
- IEC 60050 (International Electrotechnical Vocabulary) - terminology
- IEC 60027, IEC 60417, IEC 60617 - letter and graphical symbols referenced for notation and documentation
Keywords: IEC 61926-1, C/ATLAS, standard test language, ATLAS, automatic test equipment, ATE, electronics testing, design automation, test program portability.