Overview
IEC 62014-5:2015 - also published as IEEE Std 1734-2011 - defines a standardized XML format and information model for conveying quality information about electronic and software intellectual property (IP) used in System and System on Chip (SoC) designs. The standard specifies a schema, relevant terms for IP quality measurement (including software that executes on the system), and mechanisms to focus the schema on particular categories of interest to IP users. The specification supports exchange of IP quality metadata between providers, integrators, and EDA tooling.
Key topics and technical requirements
- XML schema for IP quality: A defined structure to represent IP quality metrics and attributes in machine-readable XML (commonly called the “QIP” schema).
- Information model: A quality measurement model that organizes the metrics and terms used to assess IP (hardware and embedded software).
- Golden XML and Answer XML: Schema structures for baseline (golden) metadata and completed/response XML used in exchange and evaluation workflows.
- Tooling requirements: Guidance for EDA tools and processes to create, validate, and operate on QIP-compliant XML files.
- Interoperability use model: Roles, responsibilities, and IP exchange flows that support consistent metadata exchange between IP providers, integrators, and verification teams.
- User extensions and focus: Extension points and mechanisms to tailor the schema to specific IP categories (e.g., analog/mixed-signal, RTL, MEMS, verification IP).
- Semantic consistency rules: Normative rules to ensure the meaning and consistency of reported quality data across implementations.
- Compatibility: Alignment and compatibility guidance with VSIA QIP formats and prior Quality IP approaches.
Practical applications
- Standardizing IP quality metrics for IP selection, risk assessment, and integration planning in SoC projects.
- Embedding IP metadata into EDA toolchains for automated verification, regression planning, and supply-chain management.
- Facilitating objective comparison of IP (including RTL, AMS, verification IP and embedded software) across vendors.
- Reducing integration risk, schedule slips, and mask spins by making IP quality attributes explicit and machine-readable.
Who uses this standard
- IP providers and IP catalog managers producing QIP metadata.
- SoC integrators and system architects evaluating third-party IP risk and suitability.
- EDA tool vendors implementing import/export and validation of IP quality XML.
- Verification teams, quality engineers, and procurement groups managing IP supply chains.
Related standards and resources
- IEEE Std 1734-2011 (same technical content)
- VSIA QIP (Quality IP) v4.0 materials and QIP Metric Users Guide - source influences and compatibility guidance
Keywords: IEC 62014-5:2015, Quality IP, QIP, IP quality metrics, XML schema, SoC designs, electronic design IP, IEEE 1734, IP metadata, EDA tools.