Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Document status: Active
Power combiners for low, medium and high frequency transmitters. Basic parameters. General technical requirements. Methods of measurements
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Radio beacons for short range radio engineering navigation systems. Flight test methods
Document status: Active
Photography. Overhead projectors. Film rolls, cores and winders. Dimensions
Document status: Active
Electromagnetic compatibility of technical equipment. Immunity of information technology equipment. Requirements and test methods
Document status: Cancelled
Information technology. Functional safety requirements for home and building electronic systems (HBES)
Document status: Active
