ISO 17901-1-2015 PDF

Full title and description

ISO 17901-1:2015 — Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms. This International Standard specifies terms and standardized measurement methods for determining diffraction efficiency and the angular and wavelength selectivity of holograms that produce simple, separable diffraction patterns.

Abstract

ISO 17901-1:2015 defines vocabulary and practical measurement procedures for characterizing the optical performance of holograms. It covers measurement principles, coordinate conventions, test environment and instrumentation, and procedures for absolute and relative diffraction-efficiency measurements as well as spectral (transmittance/reflectance) methods for volume holograms. Methods for measuring angular and wavelength selectivity and requirements for reporting results are included. The methods apply to holograms that yield a simple diffraction pattern and place no restriction on recording materials.

General information

• Status: Published (confirmed at ISO review)
• Publication date: July 2015
• Publisher: International Organization for Standardization (ISO)
• ICS / categories: 31.020 (Optics and photonics / Electronic components in general)
• Edition / version: Edition 1 (2015)
• Number of pages: 14

Scope

This part of ISO 17901 specifies terms related to optical characteristics of holograms and measurement methods for diffraction efficiency, angular selectivity and wavelength selectivity. It is applicable to holograms that produce a simple diffraction pattern (i.e., where the reconstructed wave is clearly separable from other diffracted or non‑diffracted waves). Holograms that produce complex diffraction patterns are excluded. The standard does not restrict the materials used to form the holograms.

Key topics and requirements

• Definitions and terms for optical characteristics of holograms (consistent vocabulary for measurement reporting).
• Coordinate system and angular conventions to be used during measurements.
• Requirements for measurement environment and test conditions (illumination, alignment, stray light control).
• Specification of measurement devices and measurable quantities (radiant flux, diffraction orders, zero order, reconstructed wave).
• Absolute diffraction-efficiency measurement method (ratio of reconstructed-wave radiant flux to incident radiant flux).
• Relative diffraction-efficiency measurement method (ratio of reconstructed-wave radiant flux to sum of fluxes of all diffraction orders).
• Spectral diffraction-efficiency methods for volume holograms by transmittance and by reflectance measurements.
• Angular selectivity: measurement of diffraction efficiency as a function of incidence angle.
• Wavelength selectivity: measurement of diffraction efficiency as a function of wavelength.
• Guidance for presenting and describing measurement results, including which method was used and any assumptions or deviations.
• Applicability notes and exclusions (e.g., complex diffraction patterns, non‑separable reconstructed waves).

Typical use and users

Used by optical and photonics laboratories, hologram manufacturers, quality-control and test facilities, research institutions, and product developers who need standardized, repeatable methods to characterize hologram performance. Also relevant to calibration and metrology labs, procurement specialists specifying acceptance tests, and standards committees developing related test and reporting practices.

Related standards

Commonly used together with ISO 17901-2:2015 (Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics) and ISO 15902 (Optics and photonics — Diffractive optics — Vocabulary). National adopters publish identical or equivalent national standards (e.g., BS ISO 17901-1:2015).

Keywords

holography; diffraction efficiency; angular selectivity; wavelength selectivity; hologram measurement; optical characterization; volume hologram; transmittance; reflectance; metrology; optics and photonics.

FAQ

Q: What is this standard?

A: ISO 17901-1:2015 is an International Standard that specifies terms and standardized methods for measuring diffraction efficiency and associated optical characteristics of holograms that yield simple diffraction patterns.

Q: What does it cover?

A: It covers vocabulary, coordinate conventions, test-environment guidance, instrumentation considerations and step-by-step methods for absolute and relative diffraction-efficiency measurements, spectral methods for volume holograms, and procedures for measuring angular and wavelength selectivity, plus guidance for reporting results.

Q: Who typically uses it?

A: Optical test laboratories, hologram and photonics manufacturers, research organizations, metrology labs, and procurement or quality teams that require standardized, comparable hologram performance data.

Q: Is it current or superseded?

A: As published in July 2015 (Edition 1) the standard is a published ISO International Standard. ISO documents are subject to periodic review; users should check their national standards body or ISO for the most recent confirmation or revision status before relying on the standard for regulatory or certification purposes.

Q: Is it part of a series?

A: Yes — it is Part 1 of the ISO 17901 series on holography. Part 2 (ISO 17901-2:2015) defines methods for measurement of hologram recording characteristics; the two parts are complementary.

Q: What are the key keywords?

A: Holography, diffraction efficiency, angular selectivity, wavelength selectivity, optical characterization, measurement methods, volume hologram, transmittance, reflectance, metrology.