ISO 17901-2-2015 PDF

Full title and description

ISO 17901-2:2015 — Optics and photonics — Holography — Part 2: Methods for measurement of hologram recording characteristics. This part defines terms and standardized measurement procedures for the exposure-related recording characteristics of holograms produced by double-beam interference, including curves and parameters used to describe recording sensitivity and index modulation amplitude for a wide range of holographic materials.

Abstract

Specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R‑value, amplitude of refractive index modulation) for holograms recorded by double‑beam interference. The standard does not restrict the materials to be measured and is not intended to constrain manufacturing processes.

General information

• Status: Published (International Standard; last reviewed and confirmed 2020; remains current).
• Publication date: July 2015.
• Publisher: International Organization for Standardization (ISO).
• ICS / categories: 31.020 (Optics and photonics / electronic components: general).
• Edition / version: Edition 1 (2015).
• Number of pages: 20.

Key bibliographic and life‑cycle data above are taken from the ISO bibliographic record for ISO 17901‑2:2015.

Scope

Defines terminology and standardized test methods to measure exposure‑related recording characteristics of holograms produced by double‑beam interference. Measurements covered include the exposure characteristic curve, exposure at half‑maximum, R‑value and the amplitude of refractive‑index modulation. The scope explicitly applies to holograms made from any suitable material and is intended to standardize measurement procedures rather than to limit material choice or manufacturing methods.

Key topics and requirements

• Standardized definitions for exposure‑related terms used in hologram recording and testing (e.g., exposure characteristic curve, exposure at half‑maximum, R‑value).
• Methods to determine exposure characteristic curves and characteristic points (e.g., E1/2 — exposure at half‑maximum).
• Procedures to measure amplitude of refractive‑index modulation for recorded holograms.
• Test arrangement and measurement conditions for double‑beam interference recordings (recommended optical configuration and reporting conventions).
• Requirements for data acquisition, reporting of experimental conditions (wavelength, angle, material type, processing), and presentation of results for comparison and reproducibility.

Typical use and users

Used by optical engineers, materials scientists, holographic film and photopolymer manufacturers, research laboratories, test and calibration laboratories, and standards bodies to: (a) evaluate and compare recording sensitivity and index modulation of holographic materials, (b) qualify materials and processes for production, and (c) provide reproducible, comparable measurement data for R&D and product specifications.

Related standards

ISO 17901‑1:2015 — Optics and photonics — Holography — Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms (companion part addressing diffraction efficiency and related optical measurements). The ISO 17901 series is maintained by ISO/TC 172/SC 9 (laser and electro‑optical systems).

Keywords

holography; hologram recording; exposure characteristic curve; exposure at half‑maximum; R‑value; refractive‑index modulation; double‑beam interference; optics; photonics; measurement methods; ISO 17901‑2:2015.

FAQ

Q: What is this standard?

A: ISO 17901‑2:2015 is an ISO international standard that defines terms and test methods for measuring the exposure‑related recording characteristics of holograms made by double‑beam interference.

Q: What does it cover?

A: It covers measurement methods for exposure characteristic curves, exposure at half‑maximum, R‑value and amplitude of refractive‑index modulation, plus recommended test conditions and reporting conventions for those measurements.

Q: Who typically uses it?

A: Optical and materials engineers, holographic film and photopolymer manufacturers, academic and industrial research labs, and testing/calibration facilities use it for material characterization, process development and inter‑laboratory comparison.

Q: Is it current or superseded?

A: The publication date is July 2015 and, according to ISO’s bibliographic record, the standard was last reviewed and confirmed in 2020 and therefore remains current as published. The ISO record shows periodic 5‑year reviews in the life cycle.

Q: Is it part of a series?

A: Yes — it is Part 2 of the ISO 17901 series on holography; Part 1 (ISO 17901‑1:2015) addresses measurement of diffraction efficiency and associated optical characteristics.

Q: What are the key keywords?

A: Holography, exposure characteristic curve, R‑value, refractive‑index modulation, diffraction efficiency (related via Part 1), double‑beam interference, optics and photonics.