Semiconductor devices. Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components
Semiconductor devices. Mechanical and climatic test methods - Acoustic microscopy for plastic encapsulated electronic components
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What is BS EN 60749-35 – Plastic encapsulated components testing about ?
BS EN 60749-35 is an international standard that focuses on mechanical and climatic test methods for semiconductor devices with acoustic microscopy for plastic encapsulated electronic components. BS EN 60749-35 defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. BS EN 60749-35 provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
Who is BS EN 60749-35
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