Semiconductor devices. Mechanical and climatic test methods - Acceleration, steady state
Semiconductor devices. Mechanical and climatic test methods - Acceleration, steady state
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What is BS EN 60749-36 – Acceleration tests of semiconductor devices about?
BS EN 60749-36 is an international standard that focuses on mechanical and climatic tests of semiconductors devices. BS EN 60749-36 provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration tests.
Who is BS EN 60749-36 – Acceleration tests on semiconductor devices for ?
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