Semiconductor devices. Mechanical and climatic test methods - Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods - Damp heat, steady state, highly accelerated stress test (HAST)
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What is BS EN IEC 60749-4 - Damp heat, steady-state, HAST of semiconductor devices about?
BS EN IEC 60749 is an international standard covering damp hear, steady-state, HAST of semiconductor devices, ensuring stable operability, and longevity in semiconductor applications . BS EN IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of the non-hermetic packaged semiconductor devices in humid environments.
Who is BS EN 60749-4 - Damp heat, steady-state, HAST of semiconductor devices for?
Упомянутые в описании и другие стандарты BS