Semiconductor devices. Mechanical and climatic test methods - Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods - Storage at high temperature
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What is BS EN IEC 60749-6 - Storage at high temperatures of semiconductor devices about?
BS EN IEC 60749 is an international standard covering storage at high temperatures of semiconductor devices, facilitating the operability and performance in electronic applications. The purpose of BS EN 60749-6 is to test and determine the effect on all-solid-state electronic devices of storage at elevated temperatures without electrical stress applied. BS EN 60749-6 test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure methods and time-to-fai...
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