Semiconductor devices. Mechanical and climatic test methods - Permanence of marking
Semiconductor devices. Mechanical and climatic test methods - Permanence of marking
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What is BS EN IEC 60749-9 - Permanence of marking of semiconductor devices about?
BS EN IEC 60749 is an international standard covering the permanence of marking of semiconductor devices, facilitating the marking and labelling of solid-state semiconductor devices for classification and authenticity of the devices. The purpose of BS EN 60749-9 is to determine whether the marks on solid-state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process. BS EN 60749-9 test is...
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