BS EN 61788-17:2013 PDF

Superconductivity - Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films

Название (английский):

BS EN 61788-17:2013

Superconductivity - Electronic characteristic measurements. Local critical current density and its distribution in large-area superconducting films

Статус документа:: Отменён
Формат:: Электронный (PDF)
Дата публикации:: 30 апреля 2013 г.
ICS:: 17.220.01
Технический комитет:: CENELEC
SKU:: BS EN 61788-17:2013

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Abstract

1 Scope This part of IEC 61788 describes the measurements of the local critical current density ( J c ) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine J c at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure J c in applied DC magnetic fields [20, 21] 2 , the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of J c and the film thickness d . The range and measurement resolution for J c d of HTS films are as follows:

— J c d : from 200 A/m to 32 kA/m (based on results, not limitation);

— Measurement resolution: 100 A/m (based on results, not limitation).

BS EN 61788-17:2013 PDF

Abstract

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Abstract

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