Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
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What is IEC 63185 about?
IEC 63185 specifies a measurement method for complex permittivity of dielectric substrates at microwave and millimetre-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimetre-wave circuits and devices. The method outlined in IEC 63185 uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is considered accurately on the basis of the mode-matching analysis. In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3 , this method has the following characteristics:
The values of the relative permittivity ε r’ and loss tangent tan δ
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