Semiconductor devices. Integrated circuits - Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Semiconductor devices. Integrated circuits - Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
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What is BS IEC 60748-4-3 - Dynamic criteria for analogue-digital converters about?
Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. IEC 60748-4 contains measuring methods for ADCs in which the test conditions are either static or change very slowly. However, some of the characteristics of an ADC can change to some degree with the rate of change of the input signal, and other characteristics cannot be measured except under dynamic conditions. Consequently, a set of dynamic tests is required in order to obtain the response of an ADC when operated under dynamic conditions. BS IEC 60748-4-3 specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics. BS IEC 60748-4-3 contains terms and definitions, characteristics and measuring methods like dynamic testing with sinusoidal signals, dynamic tests with wideband signals, linearity error of a linear ADC and differential linearity error for ADC.
Who is BS IEC 60748-4-3 - Dynamic criteria for analogue-digital converters for ? BS EN BS IEC 60748-4-3 on dynamic criteria for analogue-digital converters is useful for:
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