Standard test interface language (STIL) for digital test vector data
Standard test interface language (STIL) for digital test vector data
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What is BS IEC 62525 - Standard test interface language (STIL) for digital test vector data about?
BS IEC 62525 is an international standard that discusses standard test interface language (STIL) for digital test vector data. BS IEC 62525 outlines a test description language that:
Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT)
Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self-test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimised for application in ATE environments And ensure that the standard test interface language (STIL) meets acceptable performance criteria.
Who is BS IEC 62525 - STIL for digital test vector data
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