Overview
EN ISO 5436-1:2000 is a Geometrical Product Specification (GPS) standard that defines material measurement standards for calibrating instruments that measure surface texture using the profile method (stylus/profilometer techniques). Part 1 (Material measures) specifies design, types and metrological characteristics of physical standards used to validate vertical and horizontal profile components, stylus tip condition, spacing and roughness, and the profile coordinate system.
Key topics and technical requirements
- Scope & purpose
- Calibration of metrological characteristics of profile-based surface texture instruments (see ISO 3274).
- Provides traceable, standardized measurement standards (formerly “calibration specimens”).
- Design requirements
- Material must be hard and stable with sufficiently smooth, flat surfaces to avoid influencing evaluations.
- Measurement window size must cover traverse lengths required for intended calibrations.
- Types of measurement standards (A–E)
- Type A - Depth: Wide grooves with flat (A1) or rounded (A2) bottoms for vertical-profile calibration and depth checks.
- Type B - Tip condition: Narrow grooves, paired-pattern grooves, or fine edges (B1, B2, B3) to assess stylus tip shape/condition.
- Type C - Spacing: Repetitive groove grids (sinusoidal/triangular/arcuate) for spacing/transmission checks.
- Type D - Roughness: Irregular profiles (unidirectional or circular, D1/D2) for overall instrument calibration and averaging checks.
- Type E - Profile coordinate: Precision spheres/hemispheres or trapezoidal prism forms (E1/E2) to calibrate the instrument’s profile coordinate system.
- Metrological aspects
- Characteristics, measurands, and certification of standards (including measurement uncertainty guidance) are defined.
- A measurement standard certificate is required for traceability.
Practical applications and users
- Who uses EN ISO 5436-1:
- Calibration and metrology laboratories, instrument manufacturers (profilometers/stylus instruments), quality engineers, production inspection teams, and research labs.
- Typical applications:
- Calibrating vertical/horizontal response of profilometers.
- Verifying stylus tip condition and its effect on measured profiles.
- Checking instrument transmission for various groove spacings and amplitudes.
- Performing final overall checks of surface-roughness measurement chains and validating coordinate systems for accurate profile location.
- Benefits:
- Improves instrument traceability, repeatability and comparability of surface texture measurements across labs and production sites.
Related standards
Keywords: ISO 5436-1, EN ISO 5436-1:2000, surface texture, profile method, measurement standards, GPS, profilometer calibration, stylus instrument calibration, roughness standards.