Overview
IEC 60747-2:2025 - "Semiconductor devices – Part 2: Discrete devices – Rectifier diodes" is the fourth edition (2025) of the IEC product-specific standard for rectifier diodes. It covers generic rectifier diodes, avalanche rectifier diodes, fast-switching rectifier diodes and Schottky barrier diodes. The standard defines terminology, letter symbols, essential ratings and characteristics, measuring and test methods, and requirements for type, routine and endurance tests plus marking.
This edition introduces terms for partial thermal resistance (junction‑to‑case) and updates Clauses 3–7 to remove obsolete information and add needed clarifications.
Key topics and requirements
- Terminology & symbols: Harmonized terms and letter symbols for voltages, currents, power dissipation, switching and mechanical ratings.
- Essential ratings & characteristics: Definitions and limits for storage/operating temperatures, repetitive and non‑repetitive reverse voltages, forward currents, reverse currents, breakdown voltage (avalanche diodes), forward/reverse recovery behavior, thermal resistance and transient thermal impedance.
- Measuring & test methods: Standardized circuits and waveforms for verifying forward voltage, breakdown, reverse current, recovered charge, reverse/forward recovery, capacitive charge and thermal impedance (see annexed figures and measurement diagrams).
- Type, routine & endurance tests: Minimum type and routine test lists, endurance test conditions, acceptance-defining characteristics and criteria, and marking requirements for product identification and traceability.
- Thermal metrics: Inclusion of partial thermal resistance junction‑to‑case and methods for measuring transient thermal impedance and Rth.
Practical applications and who uses it
IEC 60747-2:2025 is essential for stakeholders involved with discrete diode products:
- Manufacturers - use the standard to specify device ratings, test procedures, and marking for product datasheets and quality control.
- Test laboratories - apply the measuring circuits and acceptance criteria for type and routine testing.
- Component & systems designers (power electronics, automotive, industrial, consumer) - rely on standardized characteristics (forward voltage, reverse recovery, thermal impedance) for reliable circuit design and thermal management.
- Procurement & compliance teams - reference the standard for supplier qualification, conformity checks and documentation.
- Reliability engineers - use endurance test definitions and acceptance criteria to assess long‑term performance.
Keywords: IEC 60747-2:2025, rectifier diodes, avalanche diodes, Schottky diodes, fast-switching diodes, thermal resistance, reverse recovery, test methods, semiconductor device standards.
Related standards
- Other parts of IEC 60747 (general semiconductor device standards)
- Relevant IEC/ISO standards for electro-technical testing, marking and conformity assessment (check normative references in the standard for exact cross-references).
For implementation, ensure you consult the full IEC 60747-2:2025 text for exact test circuits, parameter definitions and normative requirements.