Overview
IEC 62024-1:2024 - Edition 4.0 - is the International Electrotechnical Commission standard that defines electrical characteristics and measurement methods for nanohenry range chip inductors used in the high‑frequency domain (over 100 kHz). This 2024 revision (with Corrigendum 1 included) modernizes test procedures to reflect network‑analyzer based measurements and surface‑mount assembly practices.
Key topics and requirements
The standard specifies standardized measurement methods, test setups and reporting for core electrical parameters of nanohenry chip inductors, including:
- Inductance, Q‑factor and impedance - defined measurement methods and calculation formulas for consistent results.
- S‑parameter measurement - addition of two‑port and one‑port S‑parameter procedures for accurate high‑frequency characterization.
- Reflection coefficient methods - procedures for deriving inductance, Q and impedance from reflection (one‑port) network analyzer data.
- Resonance measurements - including self‑resonance frequency and resonance measured with two‑port network analyzers.
- DC resistance - voltage‑drop and bridge methods for low‑frequency resistance measurement and temperature considerations.
- Test fixtures, calibration and de‑embedding - guidance on TRL calibration, fixture representation (ABCD matrices) and eliminating residual fixture effects to obtain DUT parameters.
- Mounting and soldering - normative annex covering surface‑mount inductor mounting methods with Pb‑free solder, PCB land design, cleaning and test conditions.
- Test documentation - ensuring repeatable setups, mounting details and measurement conditions are recorded for traceability.
Practical applications and users
This standard is essential for professionals concerned with high‑frequency inductive components where consistent electrical characterization is critical:
- Inductor manufacturers - to standardize internal QC and supply data sheets with industry‑accepted measurement results.
- Test and calibration laboratories - to implement validated S‑parameter and reflection methods, calibration sequences and de‑embedding techniques.
- RF/microwave and power electronics designers - to compare components and predict circuit behavior (resonance, impedance, Q) in filters, matching networks and EMI suppression.
- Procurement and compliance teams - to specify acceptance criteria and ensure interoperability across suppliers.
- Assembly engineers - to follow recommended Pb‑free mounting practices that affect high‑frequency performance.
Related standards
- Part of the IEC 62024 series (High frequency inductive components - electrical characteristics and measuring methods).
- Prepared by IEC Technical Committee 51 (Magnetic components). Users should consult other parts of IEC 62024 and relevant calibration and RF measurement standards for full test-system implementation.
Keywords: IEC 62024-1, nanohenry range chip inductor, high frequency inductive components, S‑parameter, reflection coefficient, network analyzer, Q‑factor, self‑resonance frequency, Pb‑free solder, measurement methods.