ISO 13383-2:2012 PDF

Fine ceramics (advanced ceramics, advanced technical ceramics) — Microstructural characterization — Part 2: Determination of phase volume fraction by evaluation of micrographs

Название (английский):

ISO 13383-2:2012

Fine ceramics (advanced ceramics, advanced technical ceramics) — Microstructural characterization — Part 2: Determination of phase volume fraction by evaluation of micrographs

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 12
Дата публикации:: 28 августа 2012 г.
Издание:: ISO IS 13383 edition 1 version 1
ICS:: 81.060.30

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Описание (английский):

ISO 13383-2:2012 specifies a manual method of making measurements for the determination of the volume fraction of major phases in fine ceramics (advanced ceramics, advanced technical ceramics) using micrographs of polished and etched sections, overlaying a square grid of lines, and counting the number of intersections lying over each phase. The method applies to ceramics with one or more distinct secondary phases, such as found in Al2O3/ZrO2, Si/SiC, or Al2O3/SiCw. If the test material contains discrete pores, these are to be treated as a secondary phase for the purpose of this method, provided that there is no evidence of grain pluck-out during polishing being confused with genuine pores.

Технические детали

Технический комитет: ISO/TC 206 - Fine ceramics
SKU: ISO 13383-2:2012

Abstract

Overview

ISO 13383-2:2012 defines a manual, stereological method for determining the phase volume fraction in fine (advanced) ceramics by evaluating micrographs of polished and etched sections. The procedure overlays a transparent square grid on micrographs and counts grid-line intersections over each identifiable phase. It assumes area fractions on a random cross-section are equivalent to true volume fractions and is intended for ceramics containing distinct secondary phases (for example, Al2O3/ZrO2, Si/SiC, Al2O3/SiCw).

Key topics and requirements

Scope and principle: Use of micrographs and the grid-intersection counting technique to estimate phase volume fractions (stereological basis).
Sample preparation: Guidance on sampling, sectioning, mounting, grinding, polishing and etching to reveal phases without introducing artefacts (avoid grain pluck‑out).
Apparatus: Requirements for sectioning equipment, mounting media, diamond-based grinding/polishing, optical or scanning electron microscope (SEM), and a transparent square grid (line thickness ≤ 0.1 mm).
Microscopy selection:
- Use SEM when phase grain size or glassy films are < 2 µm.
- Optical microscopy acceptable for larger features; SEM or optical for 2–4 µm.
Photomicrography and sampling:
- At least three micrographs at sufficient magnification.
- At least 100 features of any given type across the set of images.
- Ensure representative sampling; survey multiple regions when microstructure is inhomogeneous.
Counting method: Overlay a square grid and count intersections falling on each phase to compute area/volume fractions.
Limitations & uncertainties:
- Porosity treated as a secondary phase if not from polishing damage.
- Porosity > ~20% risks artefacts during polishing.
- Phases

Overview

Key topics and requirements

Scope and principle: Use of micrographs and the grid-intersection counting technique to estimate phase volume fractions (stereological basis).
Sample preparation: Guidance on sampling, sectioning, mounting, grinding, polishing and etching to reveal phases without introducing artefacts (avoid grain pluck‑out).
Apparatus: Requirements for sectioning equipment, mounting media, diamond-based grinding/polishing, optical or scanning electron microscope (SEM), and a transparent square grid (line thickness ≤ 0.1 mm).
Microscopy selection:
- Use SEM when phase grain size or glassy films are < 2 µm.
- Optical microscopy acceptable for larger features; SEM or optical for 2–4 µm.
Photomicrography and sampling:
- At least three micrographs at sufficient magnification.
- At least 100 features of any given type across the set of images.
- Ensure representative sampling; survey multiple regions when microstructure is inhomogeneous.
Counting method: Overlay a square grid and count intersections falling on each phase to compute area/volume fractions.
Limitations & uncertainties:
- Porosity treated as a secondary phase if not from polishing damage.
- Porosity > ~20% risks artefacts during polishing.
- Phases

ISO 13383-2:2012 PDF

Технические детали

Abstract

Overview

Key topics and requirements

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Abstract

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