ISO 17470:2004 PDF
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Название (английский):
ISO 17470:2004
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Количество страниц:
- 10
- Дата публикации:
- 13 сентября 2004 г.
- Издание:
- ISO IS 17470 edition 1 version 1
- ICS:
- 71.040.99
Описание (английский):
ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
Технические детали
- Технический комитет
- ISO/TC 202/SC 2 - Electron probe microanalysis
- SKU
- ISO 17470:2004