ISO 18118:2004 PDF
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Название (английский):
ISO 18118:2004
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Количество страниц:
- 23
- Дата публикации:
- 21 мая 2004 г.
- Издание:
- ISO IS 18118 edition 1 version 1
- ICS:
- 71.040.40
Описание (английский):
ISO 18118:2004 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Технические детали
- Технический комитет
- ISO/TC 201/SC 7 - Electron spectroscopies
- SKU
- ISO 18118:2004