ISO 19668:2017 PDF
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
Название (английский):
ISO 19668:2017
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 24
- Дата публикации:
- 14 августа 2017 г.
- Издание:
- ISO IS 19668 edition 1 version 1
- ICS:
- 71.040.40
Описание (английский):
ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.
Технические детали
- Технический комитет
- ISO/TC 201/SC 7 - Electron spectroscopies
- SKU
- ISO 19668:2017