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ISO 20411:2018 PDF

Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Название (английский):
ISO 20411:2018

Surface chemical analysis — Secondary ion mass spectrometry — Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Статус документа:
Действующий
Формат:
Электронный (PDF)
Количество страниц:
15
Дата публикации:
9 марта 2018 г.
Издание:
ISO IS 20411 edition 1 version 1
ICS:
71.040.40
Описание (английский):

ISO 20411:2018 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in pulse counting magnetic sector-type secondary ion mass spectrometers or quadrupole secondary ion mass spectrometers. It uses a test based on depth profile analysis of two isotopes in a reference material which has a gradual concentration change between low and high concentration regimes. It also includes a correction method for saturated intensity caused by the dead time of the detector. The correction can increase the intensity range for 95 % linearity so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid. ISO 20411:2018 does not apply to time of flight mass spectrometers. ISO 20411:2018 is only applicable to elements with minor isotopes. It is not applicable if the element is monoisotopic or contains isotopes with equal abundances.

Технические детали

Технический комитет
ISO/TC 201/SC 6 - Secondary ion mass spectrometry
SKU
ISO 20411:2018