ISO 22493:2014 PDF
Microbeam analysis — Scanning electron microscopy — Vocabulary
Название (английский):
ISO 22493:2014
Microbeam analysis — Scanning electron microscopy — Vocabulary
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 20
- Дата публикации:
- 9 апреля 2014 г.
- Издание:
- ISO IS 22493 edition 2 version 1
- ICS:
- 01.040.37
Описание (английский):
ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate. ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
Технические детали
- Технический комитет
- ISO/TC 202/SC 1 - Terminology
- SKU
- ISO 22493:2014