ISO 23833:2013 PDF
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 27
- Дата публикации:
- 5 апреля 2013 г.
- Издание:
- ISO IS 23833 edition 2 version 1
- ICS:
- 01.040.71
ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
Технические детали
- Технический комитет
- ISO/TC 202/SC 1 - Terminology
- SKU
- ISO 23833:2013