ISO 29301:2010 PDF
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Количество страниц:
- 40
- Дата публикации:
- 17 мая 2010 г.
- Издание:
- ISO IS 29301 edition 1 version 1
- ICS:
- 37.020
ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)
Технические детали
- Технический комитет
- ISO/TC 202/SC 3 - Analytical electron microscopy
- SKU
- ISO 29301:2010