ISO 5803:2023 PDF

Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of monoclinic phase in zirconia

Название (английский):

ISO 5803:2023

Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of monoclinic phase in zirconia

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 7
Дата публикации:: 31 января 2023 г.
Издание:: ISO IS 5803 edition 1 version 1
ICS:: 81.060.30

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Описание (английский):

This document specifies a method for the qualitative and quantitative determination of the monoclinic phase present in yttria tetragonal zirconia polycrystal (Y-TZP) powders with an yttria content ≤ 6 mol% using X-ray powder diffraction. This method is also applicable for determining the monoclinic phase content in monolithic Y-TZP ceramics with an yttria content of ≤ 6 mol%. NOTE For quantitative determination of the monoclinic phase present in zirconia with a higher content of yttria or another stabilizer (e.g. MgO, CaO), this document can be referenced.

Технические детали

Технический комитет: ISO/TC 206 - Fine ceramics
SKU: ISO 5803:2023

Abstract

Overview

ISO 5803:2023 specifies a standardized X‑ray powder diffraction (XRD) test method for the qualitative and quantitative determination of the monoclinic phase in zirconia. The method applies to yttria‑stabilized tetragonal zirconia polycrystal (Y‑TZP) powders and monolithic Y‑TZP ceramics with yttria content ≤ 6 mol%. The standard describes sample preparation, recommended XRD instrumentation and scan parameters, calculation of integrated intensity ratios, and conversion to volume/mass fractions using prescribed P values.

Key topics and technical requirements

Scope: Focus on monoclinic vs tetragonal (and cubic) phase analysis in Y‑TZP (yttria ≤ 6 mol%); guidance for higher stabilizer contents is referenced.
Principle: Phase identification via XRD; quantitative analysis using the polymorph (integrated‑intensity) method. Full‑pattern/Rietveld methods are recommended for complete multiphase analysis.
Apparatus & settings:
- Copper X‑ray tube with monochromator/filter and precise goniometer (2θ error ≤ 0.5°).
- Suggested excitation ≥ 40 kV and current ≥ 35 mA.
- Qualitative scan: 2θ = 10°–80°, continuous ≤ 2°/min.
- Quantitative scan: 2θ = 26.5°–33.5°, step scanning ≤ 0.05°/step.
Sample preparation:
- Homogeneous grain size (recommended

Overview

Key topics and technical requirements

Scope: Focus on monoclinic vs tetragonal (and cubic) phase analysis in Y‑TZP (yttria ≤ 6 mol%); guidance for higher stabilizer contents is referenced.
Principle: Phase identification via XRD; quantitative analysis using the polymorph (integrated‑intensity) method. Full‑pattern/Rietveld methods are recommended for complete multiphase analysis.
Apparatus & settings:
- Copper X‑ray tube with monochromator/filter and precise goniometer (2θ error ≤ 0.5°).
- Suggested excitation ≥ 40 kV and current ≥ 35 mA.
- Qualitative scan: 2θ = 10°–80°, continuous ≤ 2°/min.
- Quantitative scan: 2θ = 26.5°–33.5°, step scanning ≤ 0.05°/step.
Sample preparation:
- Homogeneous grain size (recommended

ISO 5803:2023 PDF

Технические детали

Abstract

Overview

Key topics and technical requirements

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Abstract

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