ISO 6342:1993 PDF
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Название (английский):
ISO 6342:1993
Micrographics — Aperture cards — Method of measuring thickness of buildup area
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Количество страниц:
- 3
- Дата публикации:
- 5 августа 1993 г.
- Издание:
- ISO IS 6342 edition 1 version 1
- ICS:
- 37.080
Описание (английский):
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
Технические детали
- Технический комитет
- ISO/TC 171/SC 2 - Document file formats, EDMS systems and authenticity of information
- SKU
- ISO 6342:1993