Overview
ISO/TS 10797:2012 - Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy - defines standardized methods for using transmission electron microscopy (TEM) and energy dispersive X‑ray spectrometry (EDS) to characterize the morphology and non‑carbon elemental composition of single‑wall carbon nanotube (SWCNT) samples. The Technical Specification covers imaging, sample preparation, measurement procedures, data analysis and reporting to produce consistent, comparable TEM/EDS results for SWCNTs (and is applicable to multiwall CNTs in many respects).
Key topics and technical requirements
- Scope and purpose: Procedures to characterize SWCNT morphology and identify other materials (e.g., catalyst residues, impurities) using TEM and chemical analysis by EDS.
- Imaging modes: Guidance on TEM and high‑resolution TEM (HRTEM) imaging, bright‑field, dark‑field and high‑angle annular dark‑field (HAADF) approaches to resolve graphene wall structure, tube diameter, bundle morphology, defects and orientation.
- Analytical methods: Use of TEM‑based EDS for elemental identification and semi‑quantitative analysis at the nanometre scale; discussion of complementary techniques such as selected area electron diffraction (SAED) and electron energy loss spectroscopy (EELS).
- Sample preparation: Practical procedures for preparing powders, films, liquid suspensions and composites on suitable TEM grids to ensure representative, electron‑transparent specimens.
- Measurement procedures: Systematic examination workflows (TEM imaging, EDS point/line/area analyses), magnification and calibration considerations, and limitations (e.g., length measurement constraints).
- Data handling and reporting: Principles for interpreting TEM and EDS data, reporting formats, and recommendations to support reproducibility and inter‑laboratory comparison.
- Annexes and case studies: Informative annexes provide additional sample‑preparation guidance, observation factors, and example case studies.
Applications and who uses it
ISO/TS 10797:2012 is intended for:
- Research laboratories and academic groups studying CNT structure and properties.
- Industrial R&D and manufacturers producing or incorporating SWCNTs who need quality assessment (morphology, purity).
- Analytical and testing laboratories seeking standardized TEM/EDS protocols for SWCNT characterization and semi‑quantitative elemental analysis.
- Regulatory bodies and certification labs requiring consistent reporting and traceable measurement procedures.
Practical applications include purity assessment, catalyst residue identification, bundle and diameter analysis, defect and chirality studies, and comparative quality control of nanomaterials.
Related standards
- ISO 22493 - Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 29301 - Analytical TEM - Methods for calibrating image magnification
- ISO/TS 80004‑3 - Nanotechnologies - Vocabulary - Part 3: Carbon nano‑objects
- ISO/IEC 17025 - Competence of testing and calibration laboratories
Keywords: ISO/TS 10797:2012, nanotechnologies, SWCNT, single‑wall carbon nanotubes, TEM, HRTEM, EDS, TEM/EDS characterization, sample preparation, CNT morphology, elemental analysis.