Overview
ISO/TS 10798:2011 - Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X‑ray spectrometry analysis - defines standardized methods to characterize the morphology of single‑wall carbon nanotubes (SWCNTs) and to identify the elemental composition of catalysts and inorganic impurities in raw and purified SWCNT powders and films. The technical specification covers both scanning electron microscopy (SEM/HRSEM/FESEM) imaging and energy dispersive X‑ray spectrometry (EDX/EDS) analysis, and notes that the methods are also applicable to multiwall carbon nanotubes (MWCNTs).
Key topics and requirements
- Scope and terminology: Defines SEM/EDX vocabulary and sampling terms aligned with ISO 22493:2008 and ISO/TS 80004‑3.
- General principles: Use of SEM to resolve nanotube morphology (bundles, diameters, lengths) and EDX to detect non‑carbon elemental impurities (catalyst particles, oxides, surfactants).
- Sample preparation: Safety precautions, handling of powders and films, mounting and coating considerations to avoid coating artefacts that can affect EDX spectra.
- Measurement procedures: Guidance on appropriate accelerating voltages, detector selection (SE, BE), point analysis, and mapping approaches for SEM/EDX workflows.
- Data analysis and interpretation: How to interpret SEM images (morphology, bundling, damage) and EDX spectra (qualitative/semi‑quantitative identification of metallic catalysts and inorganic residues).
- Measurement uncertainty: Considerations for uncertainties in SEM imaging and EDX quantification and factors affecting spatial resolution and analysis volume.
- Annexes and supportive info: Normative annexes on sampling and informative case studies and examples illustrating as‑synthesized vs purified SWCNT analysis.
Applications and users
ISO/TS 10798:2011 is practical for:
- Research laboratories characterizing SWCNT morphology and purity.
- Industrial R&D and quality control teams in nanomaterials manufacturing (CNT producers, composite suppliers).
- Analytical service labs performing SEM/EDX contaminant and catalyst identification.
- Regulators and standards developers needing consistent methods for reporting CNT characterization.
Typical uses include validating purification processes, verifying catalyst removal, assessing damage/functionalization after chemical treatments, and differentiating CNT structures from other carbonaceous impurities.
Related standards
- ISO 22493:2008 - Microbeam analysis - SEM vocabulary (normative reference)
- ISO/TS 80004‑3 - Nanotechnologies - Vocabulary - Part 3: Carbon nano‑objects (normative reference)
Keywords: ISO/TS 10798:2011, single‑wall carbon nanotubes, SWCNT, SEM, FESEM, EDX, energy dispersive X‑ray spectrometry, characterization, nanotechnologies, MWCNT.