ISO/TS 17915:2013 PDF
Optics and photonics — Measurement method of semiconductor lasers for sensing
Название (английский):
ISO/TS 17915:2013
Optics and photonics — Measurement method of semiconductor lasers for sensing
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Количество страниц:
- 27
- Дата публикации:
- 25 июня 2013 г.
- Издание:
- ISO TS 17915 edition 1 version 1
- ICS:
- 31.260
Описание (английский):
ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.
Технические детали
- Технический комитет
- ISO/TC 172/SC 9 - Laser and electro-optical systems
- SKU
- ISO/TS 17915:2013