Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan method
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What is PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC about?
Integrated circuits (IC) are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. PD IEC/TS 62132-9 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit. This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. PD IEC/TS 62132-9 is applicable to testing an IC mounted on any circuit board that is accessible to the scanning probe. In some cases, it is useful to scan not only the IC but also its environment.
Who is PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC for? BS EN PD IEC/TS 62132-9 on the electromagnetic and radiated immunity of IC is useful for:
Manufacturer of electronic equipment and components
Manufacturer of electrical equipment and components
Maintenance and augmentation teams
Companies associated with designing and installation of electronic devices
Fault management teams
Quality management teams
Why should you use PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC ?
Techniques for generating near-fields over integrated circuits and their surrounding environment ca...
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