Photovoltaic (PV) modules. Test methods for the detection of potential-induced degradation - Crystalline silicon
Photovoltaic (PV) modules. Test methods for the detection of potential-induced degradation - Crystalline silicon
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What is PD IEC/TS 62804-1 - Crystalline silicon photovoltaic modules about?
The IEC 62804 series is a Technical Specification that discusses the various test methods of photovoltaic modules. PD IEC/TS 62804-1 is the first part of the series that defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high voltage stress including potential-induced degradation (PID). Two test methods are defined that do not inherently produce equivalent results. They are given as screening test neither test includes all the factors existing in the natural environment that can affect the PID rate. The methods describe how to achieve a constant stress level.
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