Russian standards PDF
Microwire for integrated circuits and semiconductor devices. General technical requirements
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Artificial intelligence. Datasets for developing and verifying machine learning models for indirectly measuring the mechanical properties of polymer composite materials. General requirements
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Artificial intelligence. Data sets for the development and verification of machine learning models for indirectly measuring the physical and mechanical properties of additive manufacturing objects. General requirements
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Optics and photonics. Optical materials. Method for measuring the nonlinearity coefficient of the refractive index
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Semiconductor devices. Methods for establishing standards and tolerances for electrical parameters
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Integrated circuits. Methods for measuring the AC voltage gain of operational amplifiers
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