SIST ISO 3310-3:2000 PDF

Test sieves -- Technical requirements and testing -- Part 3: Test sieves of electroformed sheets

Название (английский):

SIST ISO 3310-3:2000

Test sieves -- Technical requirements and testing -- Part 3: Test sieves of electroformed sheets

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 6
Дата публикации:: 1 февраля 2000 г.
ICS:: 19.120
Технический комитет:: IRUD - Mining

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Описание (английский):

La présente partie de l'ISO 3310 prescrit les exigences techniques et les méthodes de contrôle correspondantes pour les tamis de contrôle dans lesquels le fond de tamis est constitué d'une feuille métallique avec des ouvertures électroformées. Elle s'applique aux tamis de contrôle à trous ronds (circulaires) ou carrés dont les dimensions sont comprises entre 500 µm et 5 µm selon l'ISO 565.

Технические детали

SKU: SIST ISO 3310-3:2000

Abstract

Overview - ISO 3310-3:1990 (Test sieves of electroformed sheets)

ISO 3310-3:1990 specifies the technical requirements and test methods for test sieves whose sieve bottoms are made from electroformed metal sheets. This part of ISO 3310 covers sieve construction, dimensional limits, inspection procedures and handling/cleaning recommendations for very fine apertures - suitable for precision particle size analysis and laboratory control sieving.

Key topics and technical requirements

Scope and materials
- Applies to circular and square apertures formed in electroformed metal sheets. Typical nominal opening sizes are given in ISO 565 and in ISO 3310-3 are indicated from about 500 µm down to 5 µm.
Aperture arrangement
- Round holes: arranged with centers at the vertices of equilateral triangles (staggered triangular array).
- Square holes: arranged in a square grid (centers at square vertices).
Dimensional tolerances
- Tolerance on each aperture dimension is ±2 µm (applies to diameter of round holes and median of square holes).
- Preferred pitches (entrance/centre-to-centre distances) and sheet thicknesses are given in tabulated form.
Verification and inspection
- Visual check on a uniformly lit background to detect irregular openings.
- Dimensional measurement on nine measurement fields; at least five apertures measured per field.
- For apertures ≥32 µm: use microscope (×20) with an eyepiece micrometer (10–12.5 power) and measuring device capable of ±0.5 µm accuracy. Methods for apertures

Overview - ISO 3310-3:1990 (Test sieves of electroformed sheets)

Key topics and technical requirements

Scope and materials
- Applies to circular and square apertures formed in electroformed metal sheets. Typical nominal opening sizes are given in ISO 565 and in ISO 3310-3 are indicated from about 500 µm down to 5 µm.
Aperture arrangement
- Round holes: arranged with centers at the vertices of equilateral triangles (staggered triangular array).
- Square holes: arranged in a square grid (centers at square vertices).
Dimensional tolerances
- Tolerance on each aperture dimension is ±2 µm (applies to diameter of round holes and median of square holes).
- Preferred pitches (entrance/centre-to-centre distances) and sheet thicknesses are given in tabulated form.
Verification and inspection
- Visual check on a uniformly lit background to detect irregular openings.
- Dimensional measurement on nine measurement fields; at least five apertures measured per field.
- For apertures ≥32 µm: use microscope (×20) with an eyepiece micrometer (10–12.5 power) and measuring device capable of ±0.5 µm accuracy. Methods for apertures

SIST ISO 3310-3:2000 PDF

Технические детали

Abstract

Overview - ISO 3310-3:1990 (Test sieves of electroformed sheets)

Key topics and technical requirements

Похожие стандарты

Abstract

Overview - ISO 3310-3:1990 (Test sieves of electroformed sheets)

Key topics and technical requirements

Похожие стандарты

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