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Semiconductor diodes. Method of measuring of direct forward voltage and direct forward current
Document status: Active
Electromagnetic compatibility (EMC). Part 4-3. Testing and measurement techniques. Radiated, radio-frequency, electromagnetic field immunity test
Document status: Active
Liquid crystal display devices. Part 1-1. Generic. Generic specification
Document status: Active
Information technology. Open systems interconnection. Basic reference model. Part 1. The basic model
Document status: Active
Electromagnetic compatibility of technical equipment. Flikermeter. Technical requirements and test methods
Document status: Replaced by GOST R 51317.4.15-2012