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Semiconductor emitters. Methods of measurement for relative spectral energy distribution and spectral bandwidth
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Field-effect transistors. Shot-circuit forward transfer admittance modulus measurement technique
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Deflection yoke systems. Methods of measurement and control of parameters
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Oscillator, modulator and control tubes; anode dissipated power more than 25 W. Test method of test for multiple switching-on
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Image intensifier and image converter tubes. Method of checking the image eccentricity
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Radioelectronic home equipment. Reliability testing procedures
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