IEC 60689:2008 PDF

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

Название (английский):

IEC 60689:2008

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 19
Дата публикации:: 27 ноября 2008 г.
Издание:: IEC IS 60689 edition 2 version 1
ICS:: 31.140

Тип поставки:

Full version285 €Read online 24h10 €Read online 72h15 €

Язык документа:

ruen

Срок поставки:4 раб. дн. (перевод)

Цена:285 €

Описание (английский):

IEC 60689:2008 applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. This edition includes the following significant technical changes with respect to the previous edition: a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values. The title is modified and the frequency range of this second edition is extended to the range from 10 kHz to 200 kHz. b) The Lissajous method is defined in the first edition as the standard measurement method. The PI network and bridge method are used in this second edition. c) The PI network has a transformer for impedance matching. This composition differs from that of IEC 60444-1.

Технические детали

Технический комитет: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
SKU: IEC 60689:2008

Abstract

Overview

IEC 60689:2008 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz - defines measurement procedures and standard values for frequency control and selection of tuning‑fork quartz crystal units. This second edition expands the original 32 kHz wrist‑watch focus to a wider frequency band and modernizes accepted measurement techniques, providing manufacturers, test labs and designers with harmonized test methods and reference conditions.

Key topics and technical requirements

Applied frequency range: 10 kHz to 200 kHz (extended from the first edition’s 32 kHz focus).
Measurement methods:
- Method A (standard): Measurement using a vector network analyzer or vector impedance analyzer in a PI‑network configuration (IEC 60444 series based). Figures and test‑fixture diagrams are provided.
- Method B (permitted): Bridge method as a simpler alternative.
- Note: oscillator and Lissajous methods are not recommended for measuring equivalent circuit constants.
PI network details: The PI network in this edition includes a transformer for impedance matching, differing from the composition in IEC 60444‑1.
Load capacitance (standard values): 8 pF, 10 pF, 12 pF, 15 pF, 20 pF and 30 pF.
Recommended drive level: 0.1 μW.
Equipment/specs: Test equipment must cover 10 kHz–200 kHz. Tabled specifications include series resistance accuracy (1 %), signal level adjustment ranges (5 mV–1 V or 200 μA–20 mA rms) and spurious limits (40 dB max).
Environmental and measurement conditions: Defined test conditions, frequency‑temperature characterization methods (turnover point, parabolic coefficient β), and load‑capacitance frequency characteristics are included.

Applications and users

IEC 60689 is primarily used by:

Crystal manufacturers for production test, characterization and specification of tuning‑fork quartz units.
Component test laboratories and quality control teams for standardized verification and acceptance testing.
Oscillator and timekeeping device designers who need consistent frequency‑control data and load‑capacitance behavior.
Suppliers and purchasers specifying component parameters for supply contracts or product datasheets. Practical outcomes include consistent frequency specification, reliable equivalent circuit parameter measurement, and predictable temperature vs. frequency performance.

Related standards

Normative and referenced documents include:

IEC 60444 (series) - zero phase technique in a π‑network
IEC 60122‑1, IEC 60122‑3 - quartz crystal unit specifications and outlines
IEC 60027, IEC 60050‑561, IEC 60617, ISO 1000

Keywords: IEC 60689, tuning fork quartz crystal, 10 kHz to 200 kHz, measurement methods, PI network, bridge method, vector network analyzer, load capacitance, frequency‑temperature characteristics.

Overview

Key topics and technical requirements

Applied frequency range: 10 kHz to 200 kHz (extended from the first edition’s 32 kHz focus).
Measurement methods:
- Method A (standard): Measurement using a vector network analyzer or vector impedance analyzer in a PI‑network configuration (IEC 60444 series based). Figures and test‑fixture diagrams are provided.
- Method B (permitted): Bridge method as a simpler alternative.
- Note: oscillator and Lissajous methods are not recommended for measuring equivalent circuit constants.
PI network details: The PI network in this edition includes a transformer for impedance matching, differing from the composition in IEC 60444‑1.
Load capacitance (standard values): 8 pF, 10 pF, 12 pF, 15 pF, 20 pF and 30 pF.
Recommended drive level: 0.1 μW.
Equipment/specs: Test equipment must cover 10 kHz–200 kHz. Tabled specifications include series resistance accuracy (1 %), signal level adjustment ranges (5 mV–1 V or 200 μA–20 mA rms) and spurious limits (40 dB max).
Environmental and measurement conditions: Defined test conditions, frequency‑temperature characterization methods (turnover point, parabolic coefficient β), and load‑capacitance frequency characteristics are included.

Applications and users

IEC 60689 is primarily used by:

Crystal manufacturers for production test, characterization and specification of tuning‑fork quartz units.
Component test laboratories and quality control teams for standardized verification and acceptance testing.
Oscillator and timekeeping device designers who need consistent frequency‑control data and load‑capacitance behavior.
Suppliers and purchasers specifying component parameters for supply contracts or product datasheets. Practical outcomes include consistent frequency specification, reliable equivalent circuit parameter measurement, and predictable temperature vs. frequency performance.

Related standards

Normative and referenced documents include:

IEC 60444 (series) - zero phase technique in a π‑network
IEC 60122‑1, IEC 60122‑3 - quartz crystal unit specifications and outlines
IEC 60027, IEC 60050‑561, IEC 60617, ISO 1000

Keywords: IEC 60689, tuning fork quartz crystal, 10 kHz to 200 kHz, measurement methods, PI network, bridge method, vector network analyzer, load capacitance, frequency‑temperature characteristics.

IEC 60689:2008 PDF

Технические детали

Abstract

Overview

Key topics and technical requirements

Applications and users

Related standards

Похожие стандарты

Abstract

Overview

Key topics and technical requirements

Applications and users

Related standards

Похожие стандарты

Measurement of quartz crystal unit parameters - Standard method for the determination of the load resonance f…

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

Amendment 2 - Letter symbols to be used in electrical technology - Part 1: General

Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and elect…

Quality management — Guidelines for configuration management