IEC TS 62607-6-24:2026 PDF

Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast

First page of standard IEC TS 62607-6-24:2026

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Title (English):

IEC TS 62607-6-24:2026

Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast

Document status:: Active
Format:: Electronic (PDF)
Number of pages:: 21
Publication date:: June 29, 2026
Edition:: IEC TS 62607 edition 1 version 1
ICS:: 07.120

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Description (English):

IEC TS 62607-6-24:2026 which is a Technical Specification, establishes a standardized method to determine the key control characteristic (KCC) • number of layer distribution for CVD graphene film by • optical contrast measurement The number of layers and number of layer distribution of CVD graphene film is derived by G‑channel contrast values. This method is applicable for clean CVD graphene film without twisted multilayer structures on a SiO2/Si substrate.

Technical details

Technical committee: TC 113 - Nanotechnology for electrotechnical products and systems
SKU: IEC TS 62607-6-24:2026

Abstract

Overview

IEC TS 62607-6-24:2026 - Nanomanufacturing - Key control characteristics - Part 6-24: Graphene-related products - Number of layers of graphene: optical contrast is a technical specification developed by the International Electrotechnical Commission (IEC). This standard establishes a globally applicable, standardized method for determining the key control characteristic-specifically, the number of layer distribution-for chemical vapor deposition (CVD) graphene films using optical contrast measurements. The methodology defined in this specification is intended for clean CVD graphene films, free of twisted multilayer structures, on SiO₂/Si substrates.

Monitoring and specifying the number of layers in graphene films is essential, as these features directly influence the electronic, mechanical, and optical properties of materials used in numerous advanced applications. The optical contrast method offers a reliable, efficient, and non-destructive means of characterizing layer distribution across large areas, supporting industrial-scale graphene manufacturing and quality control.

Key Topics

Number of Layer Distribution: Specifies how to assess the distribution of mono- and multilayer domains within a CVD graphene film by analyzing optical contrast.
Optical Contrast Measurement: Details a non-destructive technique using optical microscopy and digital imaging, focusing on the green channel (G-channel) value for high sensitivity to graphene layers.
Measurement Procedure: Outlines steps including white balance calibration, sample preparation, optical imaging, data extraction from optical images, statistical analysis, and reporting results.
Applicability: The method is tailored for clean, non-twisted CVD graphene films on standardized SiO₂/Si substrates.
Data Analysis: Involves extracting G-channel contrast values from optical images, constructing statistical histograms, and determining area proportions for domains of different layer numbers.
Reporting: Defines requirements for documenting test parameters, equipment details, optical images, contrast images, histograms, and comprehensive error analysis.

Applications

The standardized optical contrast method as defined by IEC TS 62607-6-24:2026 has broad relevance for various sectors within nanomanufacturing and graphene technology:

Abstract

Overview

Key Topics

Number of Layer Distribution: Specifies how to assess the distribution of mono- and multilayer domains within a CVD graphene film by analyzing optical contrast.
Optical Contrast Measurement: Details a non-destructive technique using optical microscopy and digital imaging, focusing on the green channel (G-channel) value for high sensitivity to graphene layers.
Measurement Procedure: Outlines steps including white balance calibration, sample preparation, optical imaging, data extraction from optical images, statistical analysis, and reporting results.
Applicability: The method is tailored for clean, non-twisted CVD graphene films on standardized SiO₂/Si substrates.
Data Analysis: Involves extracting G-channel contrast values from optical images, constructing statistical histograms, and determining area proportions for domains of different layer numbers.
Reporting: Defines requirements for documenting test parameters, equipment details, optical images, contrast images, histograms, and comprehensive error analysis.

Applications

The standardized optical contrast method as defined by IEC TS 62607-6-24:2026 has broad relevance for various sectors within nanomanufacturing and graphene technology:

IEC TS 62607-6-24:2026 PDF

Technical details

Abstract

Overview

Key Topics

Applications

Abstract

Overview

Key Topics

Applications

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